Linda Milor : rechercher sur Z-Library

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Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysis

Chen, Chang-Chih, Ahmed, Fahad, Milor, Linda

Journal:

Microelectronics Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 2.46 MB

english, 2013

[IEEE 2014 Conference on Design of Circuits and Integrated Systems (DCIS) - Madrid, Spain (2014.11.26-2014.11.28)] Design of Circuits and Integrated Systems - System-level modeling of microprocessor reliability degradation due to TDDB

Chen, Chang-Chih, Cha, Soonyoung, Milor, Linda

Année:

2014

Langue:

english

Fichier:

PDF, 800 KB

english, 2014

Processor-level reliability simulator for time-dependent gate dielectric breakdown

Chen, Chang-Chih, Liu, Taizhi, Cha, Soonyoung, Milor, Linda

Journal:

Microprocessors and Microsystems

Année:

2015

Langue:

english

Fichier:

PDF, 5.06 MB

english, 2015

Impact of irregular geometries on low-k dielectric breakdown

Muhammad Bashir, Linda Milor, Dae Hyun Kim, Sung Kyu Lim

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 631 KB

english, 2011

Impact of Linewidth on Backend Dielectric TDDB and Incorporation of the Linewidth Effect in Full Chip Lifetime Analysis

Bashir, Muhammad M., Milor, Linda

Journal:

IEEE Transactions on Semiconductor Manufacturing

Année:

2015

Langue:

english

Fichier:

PDF, 1.87 MB

english, 2015

AVERT: An elaborate model for simulating variable retention time in DRAMs

Kim, Dae-Hyun, Cha, Soonyoung, Milor, Linda S.

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.29 MB

english, 2015

Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models

Changsoo Hong, Linda Milor, Munkang Choi, Tom Lin

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 656 KB

english, 2005

Modeling of the breakdown mechanisms for porous copper/low-k process flows

Changsoo Hong, Linda Milor

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 656 KB

english, 2007

Backend dielectric breakdown dependence on linewidth and pattern density

Linda Milor, Changsoo Hong

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 732 KB

english, 2007

A methodology to extract failure rates for low-k dielectric breakdown with multiple geometries and in the presence of die-to-die linewidth variation

Muhammad Bashir, Linda Milor

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 774 KB

english, 2009

Methodology to determine the impact of linewidth variation on chip scale copper/low-k backend dielectric breakdown

Muhammad Bashir, Linda Milor, Dae Hyun Kim, Sung Kyu Lim

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 603 KB

english, 2010

Backend dielectric reliability simulator for microprocessor system

Chang-Chih Chen, Fahad Ahmed, Dae Hyun Kim, Sung Kyu Lim, Linda Milor

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2012

[IEEE 2011 4th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI) - Savelletri di Fasano, Italy (2011.06.28-2011.06.29)] 2011 4th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI) - NBTI resistant SRAM design

Ahmed, Fahad, Milor, Linda

Année:

2011

Langue:

english

Fichier:

PDF, 602 KB

english, 2011

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - System-level modeling of microprocessor reliability degradation due to BTI and HCI

Chen, Chang-Chih, Soonyoung Cha,, Taizhi Liu,, Milor, Linda

Année:

2014

Langue:

english

Fichier:

PDF, 2.22 MB

english, 2014

Comprehensive reliability and aging analysis on SRAMs within microprocessor systems

Liu, Taizhi, Chen, Chang-Chih, Kim, Woongrae, Milor, Linda

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.91 MB

english, 2015

System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown

Liu, Taizhi, Chen, Chang-Chih, Cha, Soonyoung, Milor, Linda

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2015

The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system

Cha, Soonyoung, Kim, Dae-Hyun, Liu, Taizhi, Milor, Linda S.

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 2.95 MB

english, 2015

Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs

Kim, Dae-Hyun, Cha, Soonyoung, Milor, Linda S.

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 2.36 MB

english, 2015

[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - ECC-ASPIRIN: An ECC-assisted post-package repair scheme for aging errors in DRAMs

Kim, Dae-Hyun, Milor, Linda S.

Année:

2016

Langue:

english

Fichier:

PDF, 470 KB

english, 2016

Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements

Cha, Soonyoung, Liu, Taizhi, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Année:

2017

Langue:

english

Fichier:

PDF, 4.07 MB

english, 2017

[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Année:

2018

Langue:

english

Fichier:

PDF, 741 KB

english, 2018

[IEEE 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Otranto, Italy (2019.6.13-2019.6.14)] 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor

Zhang, Rui, Yang, Kexin, Liu, Taizhi, Milor, Linda

Année:

2019

Langue:

english

Fichier:

PDF, 1.37 MB

english, 2019

[IEEE 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) - Bilbao, Spain (2019.11.20-2019.11.22)] 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) - Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators

Hsu, Shu-Han, Yang, Kexin, Milor, Linda

Année:

2019

Fichier:

PDF, 8.22 MB

2019

SRAM Stability Analysis and PerformanceâReliability Tradeoff for Different Cache Configurations

Zhang, Rui, Liu, Taizhi, Yang, Kexin, Chen, Chang-Chih, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Année:

2020

Fichier:

PDF, 2.33 MB

2020

[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Inverse Design of FinFET SRAM Cells

Zhang, Rui, Liu, Zhaocheng, Yang, Kexin, Liu, Taizhi, Cai, Wenshan, Milor, Linda

Année:

2020

Fichier:

PDF, 799 KB

2020

Via wearout detection with on-chip monitors

Fahad Ahmed, Linda Milor

Journal:

Microelectronics Journal

Année:

2010

Langue:

english

Fichier:

PDF, 1.03 MB

english, 2010

Timing analysis with compact variation-aware standard cell models

Seyed-Abdollah Aftabjahani, Linda Milor

Journal:

Integration, the VLSI Journal

Année:

2009

Langue:

english

Fichier:

PDF, 635 KB

english, 2009

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Impact of NBTI on analog components

Zhengliang, L V, Milor, Linda, Yang, Shiyuan

Année:

2012

Langue:

english

Fichier:

PDF, 187 KB

english, 2012

[IEEE 2007 2nd International Workshop on Advances in Sensors and Interface - Bari, Italy (2007.06.26-2007.06.27)] 2007 2nd International Workshop on Advances in Sensors and Interface - BIST for testing of delay

Milor, Linda, Cheng Jia,

Année:

2007

Langue:

english

Fichier:

PDF, 1.20 MB

english, 2007

Simulation of system backend dielectric reliability

Chen, Chang-Chih, Bashir, Muhammad, Milor, Linda, Hyun Kim, Dae, Kyu Lim, Sung

Journal:

Microelectronics Journal

Année:

2014

Langue:

english

Fichier:

PDF, 1.53 MB

english, 2014

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells

Kim, Woongrae, Milor, Linda

Année:

2014

Langue:

english

Fichier:

PDF, 490 KB

english, 2014

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements

Cha, Soonyoung, Chen, Chang-Chih, Liu, Taizhi, Milor, Linda S.

Année:

2014

Langue:

english

Fichier:

PDF, 1.87 MB

english, 2014

Backend Dielectric Reliability Full Chip Simulator

Bashir, Muhammad Muqarrab, Chen, Chang-Chih, Milor, Linda, Kim, Dae Hyun, Lim, Sung Kyu

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Année:

2014

Langue:

english

Fichier:

PDF, 2.82 MB

english, 2014

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Ring oscillator based embedded structure for decoupling PMOS/NMOS degradation with switching activity replication

Ahmed, Fahad, Milor, Linda

Année:

2010

Langue:

english

Fichier:

PDF, 347 KB

english, 2010

[IEEE 2009 IEEE International Interconnect Technology Conference - IITC - Sapporo, Japan (2009.06.1-2009.06.3)] 2009 IEEE International Interconnect Technology Conference - Determination of the impact of field enhancement in low-k dielectric breakdown

Bashir, Muhammad, Milor, Linda

Année:

2009

Langue:

english

Fichier:

PDF, 756 KB

english, 2009

[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - TDDB chip reliability in copper interconnects

Bashir, Muhammad, Kim, Dae Hyun, Lim, Sung Kyu, Milor, Linda

Année:

2010

Langue:

english

Fichier:

PDF, 304 KB

english, 2010

[IEEE 2012 IEEE 30th International Conference on Computer Design (ICCD 2012) - Montreal, QC, Canada (2012.09.30-2012.10.3)] 2012 IEEE 30th International Conference on Computer Design (ICCD) - A comparative study of wearout mechanisms in state-of-art microprocessors

Chen, Chang-Chih, Ahmed, Fahad, Milor, Linda

Année:

2012

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2012

[IEEE 2009 3rd International Workshop on Advances in sensors and Interfaces - Trani, Italy (2009.06.25-2009.06.26)] 2009 3rd International Workshop on Advances in sensors and Interfaces - Via wearout detection with on chip monitors

Ahmed, Fahad, Milor, Linda

Année:

2009

Langue:

english

Fichier:

PDF, 310 KB

english, 2009

[IEEE 2013 5th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI) - Bari, Italy (2013.06.13-2013.06.14)] 5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI - System-level modeling and reliability analysis of microprocessor systems

Chen, Chang-Chih, Milor, Linda

Année:

2013

Langue:

english

Fichier:

PDF, 1.77 MB

english, 2013

[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - Wearout-aware compiler-directed register assignment for embedded systems

Ahmed, Fahad, Sabry, Mohamed M., Atienza, David, Milor, Linda

Année:

2012

Langue:

english

Fichier:

PDF, 785 KB

english, 2012

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Towards a chip level reliability simulator for copper/low-k backend processes

Bashir, Muhammad, Milor, Linda

Année:

2010

Langue:

english

Fichier:

PDF, 370 KB

english, 2010

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Compact Variation-Aware Standard Cell Models for Timing Analysis - Complexity and Accuracy Analysis

Aftabjahani, Seyed-Abdollah, Milor, Linda S.

Année:

2008

Langue:

english

Fichier:

PDF, 214 KB

english, 2008

A BIST Circuit for DLL Fault Detection

Jia, Cheng, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Année:

2008

Langue:

english

Fichier:

PDF, 638 KB

english, 2008

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Analysis of the impact of linewidth variation on low-k dielectric breakdown

Bashir, Muhammad M., Milor, Linda

Année:

2010

Langue:

english

Fichier:

PDF, 399 KB

english, 2010

[IEEE 2014 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - San Hose, CA, USA (2014.5.20-2014.5.23)] IEEE International Interconnect Technology Conference - Impact of die partitioning on reliability and yield of 3D DRAM

Kim, Woongrae, Kim, Dae-Hyun, Hong, Hee Il, Milor, Linda, Lim, Sung Kyu

Année:

2014

Langue:

english

Fichier:

PDF, 401 KB

english, 2014

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Backend dielectric chip reliability simulator for complex interconnect geometries

Chen, Chang-Chih, Bashir, Muhammad, Milor, Linda, Kim, Dae Hyun, Lim, Sung Kyu

Année:

2012

Langue:

english

Fichier:

PDF, 422 KB

english, 2012

[IEEE 2009 IEEE International Conference on Computer Design (ICCD 2009) - Lake Tahoe, CA, USA (2009.10.4-2009.10.7)] 2009 IEEE International Conference on Computer Design - Reliable cache design with detection of gate oxide breakdown using BIST

Ahmed, Fahad, Milor, Linda

Année:

2009

Langue:

english

Fichier:

PDF, 535 KB

english, 2009

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Backend low-k TDDB chip reliability simulator

Bashir, Muhammad, Kim, Dae Hyun, Athikulwongse, Krit, Lim, Sung Kyu, Milor, Linda

Année:

2011

Langue:

english

Fichier:

PDF, 846 KB

english, 2011

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Porosity-Induced Electric Field Enhancement and Its Impact on Charge Transport in Porous Inter-Metal Dielectrics

Hong, Changsoo, Milor, Linda

Année:

2006

Langue:

english

Fichier:

PDF, 235 KB

english, 2006

[IEEE 2009 IEEE International Interconnect Technology Conference - IITC - Sapporo, Japan (2009.06.1-2009.06.3)] 2009 IEEE International Interconnect Technology Conference - On chip monitoring of via degradation

Ahmed, Fahad, Milor, Linda

Année:

2009

Langue:

english

Fichier:

PDF, 381 KB

english, 2009